Precision agriculture--How is it working? is the theme of a special field day beginning at 1:30 p.m. onTuesday August 25 at the Northeast Research Farm near Nashua. The field day will showcase the initial activities of a 3-year Precision Agriculture Demonstration Project organized by Iowa State University and Hawkeye Community College.
Management decisions on the 40-acre project site have been made based on integrated crop management (ICM) principles and information gathered using the latest global positioning systems/geographic information systems (GPS/GIS) technologies. Technology will be available to do site-specific sampling; to analyze samples in parts per million or parts per billion; to vary the application rate of seed, nutrients, and pesticides; and to monitor resulting yields during harvest. Static displays related to various facets of precision agriculture will be included in an informational tent at the tour site. The field day is designed to answer questions such as How accurate is the information we're collecting? Have these new technologies made us more efficient and our farming operations more profitable? Are we making better decisions because of this information?
Wagon tour stops and presenters will include the following:
Lessons Learned--Year 1
- Ken Pecinovsky (Northeast Research Farm superintendent)
- Bill Lotz (ISU extension field specialist-crops)
Lessons Learned--Year 2
- Joyce Dolan (project scout)
- George Cummins (ISU extension field specialist-crops)
New Technologies--Can I Afford To Buy In?
- Mike Duffy (ISU extension economist)
- Fertilizer Application--How Precise Is It?
- Mike White (ISU extension field specialist-crops)
- Dan Meyer (ISU extension ag engineer)
The field day is free and open to the public. Preregistration is not required. CCA credits have been requested. The Northeast Research Farm is located 1 mile south and 1 1/2 miles west of Nashua. Additional information on the field day can be obtained from your county extension office or by calling me, the field day coordinator, at 515-228-1453.
This article originally appeared on pages 161-162 of the IC-480(21) -- August 10, 1998 issue.